• ABOUT

Silvestri
Francesco


Contact Data

Phone: + 34 935 801 853
Ext: 283
Fax: + 34 935 805 729
E-mail: [javascript protected email address]
Dep: Nanostructured Materials

Bio

I was born in Rome, Italy, and there I have got my Bachelor’s and Master’s degrees in Materials Science at Università degli Studi di Roma Tor Vergata. After that, in 2015, I joined the group of Prof. Franco Cacialli at University College London, UK, as an Early Stage Researcher (ESR) in the European Innovative Training Network (ITN) named OSNIRO (Organic Semiconductors for NIR Optoelectronics). My 18-months position was dedicated to the selection of new organic NIR sensitive absorbers and the optimization of organic photodiodes. Later on, in September 2017, I started my PhD in the group of Physical Chemistry of Surfaces and Interfaces at the Institut de Ciència de Materials de Barcelona (ICMAB), headed by Dr. Esther Barrena and Prof. Carmen Ocal. My current position at ICMAB is an ESR position in the ITN SEPOMO (Spins in Efficient Photovoltaic devices based on Organic MOlecules).

The general basis of the work in SEPOMO is to achieve a better understanding of the effects of spin-dependent processes in organic solar cells and subsequently find ways to deliberately tune the spin-dependent mechanisms involved in light harvesting.

In particular, the specific focus of my research is tackling the connection between structural/morphological properties, optical properties and performance of organic photovoltaic devices; the morphological picture of the active materials will be complemented using different techniques such as x-ray diffraction and scanning probe microscopy. These investigations will provide detailed information about the structural properties in regards to morphology, crystalline order, orientation, length scale of separation of domains. The combination of these techniques is fundamental to establish structure-property-performance relationships that guide the synthesis and optimization of the materials and serve as input for the simulation of the active layer morphology.

 

 
 
 
 

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