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23 JAN 2017: III Workshop on Materials Characterisation by Diffraction Methods

23 JAN 2017: III Workshop on Materials Characterisation by Diffraction Methods

News 01 January 23 January 2016 711 hits

Registration Deadline: 16 January 2017

09:00 REGISTRATION
09:30 WORKSHOP PRESENTATION AND BRIEF INTRODUCTION
Xavier Obradors (Director of ICMAB)
Jordi Rius (Organizer of the workshop)

9:45 Enrico Mugnanioli (University of Siena)
“Application of electron diffraction tomography to nanomaterials characterisation” 
10:45 Josep Bassas  (CCiTUB, University of Barcelona)
“ High resolution X-ray diffraction “

11:15 COFFEE BREAK

11:45 Jose Santiso  (CIN2)
“Application of X-ray diffraction for time-resolved experiments on thin films  under non-ambient conditions”
12:30 Anna Crespi  (ICMAB-CSIC)
“Applications of 2D detectors to materials characterisation (textures)”
13:00 Carlos Frontera  (ICMAB-CSIC)
“3D reciprocal space maps in thin films”

13:30 LUNCH BREAK

15:00 Xavier Alcobé  (CCiTUB, University of Barcelona)
“Application of XRD to the quantitative analysis of materials”
15:45 Oriol Vallcorba (ALBA-CELLS)
"Synchrotron tts-microdiffraction and related transmission diffraction methodologies for materials characterisation"

16:30 END OF WORKSHOP

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