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Epitaxial ferromagnetic oxide thin films on silicon with atomically sharp interfaces

Epitaxial ferromagnetic oxide thin films on silicon with atomically sharp interfaces

P. de Coux, R. Bachelet, B. Warot-Fonrose, V. Skumryev, L. Lupina, G. Niu, T. Schroeder, J. Fontcuberta and F. Sánchez. Appl. Phys. Lett. 105, 012401 (2014)

Beware the impact factor

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The journal impact factor is a good predictor of the quality of journals as measured by citations to primary research articles. It is, however, a poor indicator of citations to specific papers or of the future performance of individual researchers.

EDITORIAL Nature Materials, 12, 89 (2013)

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