Rapid Thermal Annealing of Double Perovskite Thin Films Formed by Polymer Assisted Deposition
23 February 2021

The annealing process is an important step common to epitaxial films prepared by chemical solution deposition methods. It is so because the final microstructure of the films can be severely affected by the precise features of the thermal processing. In this work we analyze the structural and magnetic properties of double perovskite La2CoMnO6 and La2NiMnO6 epitaxial thin films prepared by polymer-assisted deposition (PAD) and crystallized by rapid thermal annealing (RTA).

It is found that samples prepared by RTA have similar values of saturation magnetization and Curie temperature to their counterparts prepared by using conventional thermal annealing (CTA) processes, thus indicating low influence of the heating rates on the B-B’ site cationic ordering of the A2BB’O6 double perovskite structure. However, a deeper analysis of the magnetic behavior suggested some differences in the actual microstructure of the films.

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Oxides for new-generation electronics

Rapid Thermal Annealing of Double Perovskite Thin Films Formed by Polymer Assisted Deposition

Hailin Wang, Carlos Frontera, Benjamín Martínez * and Narcís Mestres *

Materials 202013(21), 4966

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