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  • ICMAB Workshop on STEM2021

    Fundamentals of Scanning Transmission Electron Microscopy (STEM) Imaging and Spectroscopy

    Wednesday, 15 December 2021


This workshop includes lectures concerning different Scanning Transmission Electron Microscopy (STEM) imaging and spectroscopic techniques and their application to materials science.

The workshop will cover fundamentals of STEM, basic and advanced STEM imaging (HAADF, ABF, iDPC, and 4D STEM) as well as acquisition and analysis of electron energy loss spectroscopy (EELS) and energy-dispersive x-ray spectroscopy (EDX) data.

Who should attend ICMAB Workshop on STEM?

This workshop intends to cover the basics of STEM imaging and spectroscopy for the PhD fellows and researchers who would like to use these techniques in their research, and either have no or little experience with STEM. So, if you have no idea about STEM, don’t worry! This workshop is for you. And if you know how to acquire STEM data, but you feel like you need to understand them better, or you have difficulties interpreting them, again this workshop is a great choice for you!

The workshop will take place on December 15, 2021, at the Institute of Materials Science of Barcelona (ICMAB-CSIC).


Luiz Tizei

Luiz Tizei has a Bachelor in Physics (2005) from the Universidade de Campinas, Brazil, and in 2011 he obtained his PhD, from the IFGW at UNICAMP, with a thesis concentrated on the chemical and physical properties of III-V semiconductor nanowires. He then joined the STEM group at the Laboratoire de Physique des Solides (LPS), Orsay, France, for a post-doc between 2011 and 2013, during which he built a light intensity interferometer to detect single photon sources excited by fast electrons (cathodoluminescence) in an electron microscope. Between October 2013 and December 2014 he worked with at the AIST-Tsukuba on electron spectroscopy of individual atoms, molecules, and atomically thin layers. In December 2014 he was hired by the CNRS to work at the LPS. His research is focused on the development of electron spectroscopy techniques and their application to nano-optics.

Patricia Abellán

Patricia Abellán received her BSc in Physics from the Aalborg University (Denmark) and her Ph.D. in Materials Sciences from the Autonomous University of Barcelona and Institute of Materials Science of Barcelona (ICMAB-CSIC), Spain, in 2011. She has held postdoctoral positions at the University of California – Davis and Pacific Northwest National Laboratory, USA and a staff scientist position at SuperSTEM Laboratory (Daresbury, UK). Currently, she is a CNRS researcher (tenured) at Institute of Materials Jean Rouxel (IMN), at Nantes University. Her research focuses on the study of defects at interfaces on functional materials and their relationship with properties using electron microscopy and on the use of the effect of the electron beam in solid and liquid media to investigate nanomaterials properties.

Sonia Estrade

Sonia Estrade obtained a Degree in Physics (2005) and a PhD in Nanoscience (2009), all of them at Universitat de Barcelona. She is currently a Professor at the Department of Electronic and Biomedical Engineering of UB. Her main research interest focuses in EELS applied to semiconductors for photovoltaic and photonic devices to complex oxides for energy production or sensing applications. She is currently applying big data analytics to EEL spectra for advanced materials characterization. She is also the president of the Gender Equality Commission of the Faculty of Physics at UB, and the president of AMIT-Cat.


Gabriel Sánchez Santolino

Gabriel Sánchez  Santolino received his BSc and Ph.D. (2015) in Physics from the Complutense University of Madrid. During his Ph.D., he also carried out part of his research at the STEM group at Oak Ridge National Laboratory. He then joined the Crystal Interface Laboratory at the University of Tokyo as a postdoctoral researcher from 2015 to 2017. In 2017, he obtained a Juan de la Cierva postdoctoral fellowship and joined the 2D Foundry group at the Spanish National Research Council in the Institute of Materials Science of Madrid. In 2019 he joined the Eva Olsson Group at Chalmers University of Technology. From November2019, he is a Jóvenes Investigadores (JIN) Researcher at the Department of Materials Physics at the Complutense University of Madrid. His main research interest is the direct visualization of local electromagnetic field structures by Differential Phase Contrast Scanning Transmission Electron Microscopy (DPC-STEM), and four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM) for diffraction and phase contrast imaging.



María Varela del Arco

María Varela del Arco has a doctorate (2001) in Physics from the Complutense University of Madrid. In 2002, after obtaining her doctorate, she joined the Solid State Division of Oak Ridge National Laboratory (Tennessee, USA) with a prestigious Wigner Fellowship contract. In 2011 she returned to Spain as a tenured professor at the UCM Faculty of Physical Sciences after receiving a Starting Investigator Award from the European Research Council. She currently holds a full professorship in the area of condensed matter physics since 2017, and has extensive experience in the characterization of low-dimensional systems such as thin films and superstructures of complex materials of interest in spintronics and magnetism. She is an internationally renowned expert in electron microscopy and spectroscopy. In 2014 she received the prestigious Burton Medal from the Microscopy Society of America, and in 2016 she was named a fellow of the American Physical Society.



9:00 – 9:15: Welcome and introduction

Session 1:

9:15 – 10:30

“STEM imaging, from basic to advanced”

María Varela del Arco, Departamento de Física de Materiales, Universidad Complutense de Madrid, Spain. 


10:30 – 10:45: Break


10:45 – 12:00

“EELS - fundamentals and core loss data analysis”

Sonia Estradé Albiol, Departament d'Electrònica de la Facultat de Fïsica de la Universitat de Barcelona, Spain. 


12:00 – 13:15

“Fundamentals of 4D Scanning Transmission Electron Microscopy”

Gabriel Sánchez Santolino, Departamento de Física de Materiales, Universidad Complutense de Madrid, Spain. 


13:15 – 14:30: Lunch break



Session 2:


14:30 – 15:45

“Nano-scale optics with fast electron spectroscopies”

Luiz Galvao Tizei, CNRS researcher at the Laboratory Physique des Solides (LPS), Université Paris-Saclay, France. 


15:45 – 17:00

“The study of dynamic processes in solution and solid-liquid interfaces inside an electron microscope”.

Patricia Abellán Baeza, CNRS researcher at the Institute of Materials Jean Rouxel (IMN), University of Nantes, France. 



This workshop is organized by Jaume Gázquez, researcher at ICMAB-CSIC.
Jaume Gazquez obtained his PhD in Materials Science (Universitat Autònoma de Barcelona) in 2007, having performed the research in the Materials Science Institute of Barcelona (ICMAB-CSC). He enrolled afterwards in the STEM Group of the Oak Ridge National Laboratory (ORNL). In September 2010 he joined back the ICMAB as a JAE-doc. In 2013 he secured a Ramón y Cajal contract and since July 2020 he is a CSIC Tenured Scientist.




ICMAB Sala d’Actes Carles Miravitlles and online via Zoom.