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SCIENTIFIC & TECHNICAL SERVICES

Scanning Probe Microscopy Laboratory

The Scanning Probe Microscopy (SPM) Lab offers SPM related experiments both to the ICMAB community and to external users.

We are open to all reserachers at ICMAB who would like to use the SPM equipment for their research and to other researchers from any other research center, university, technological center, spin off or industry. We are also open to international researchers who would like to do some measurements with us, and researchers who are within the NFFA Europe project initiative.

To request a service, follow the Request Service Form link and we will get in contact with you. You can also contact us by mail if you have any doubts or would like a special request (This email address is being protected from spambots. You need JavaScript enabled to view it. / This email address is being protected from spambots. You need JavaScript enabled to view it.).

See you at the SPM Lab!

Scanning Probe Microscopy Service Equipment

Park System NX10

Scanner 

  • 100 μm × 100 μm range in XY
  • 15 μm range in Z

Stage

  • XY stage travel range of  20 mm × 20 mm

Optical microscope

  • Tip possitioning by optical microscopy
  • Field of view: 480 μm × 360 μm
  • 10 × objective lens

Sample mounting

  • Sample size: Open space up to 100 mm x 100 mm, thickness up to 20 mm

4 channels of flexible digital lock-in amplifier

Keysight 5500 AFM

Keysight 5500 has a 90x90 microns in X/Y and 15 microns in the Z axis closed loop scanner. 
The SPM is equipped with three independent Lock-in amplifiers that can be fully configured through the use of an external Signal Access Box.
The equipment can be used with the following modes: 
  • Piezoresponse Force Microscopy
  • Bimodal Atomic Force Microscopy
  • Dynamic Topography.

It also has a Closed Loop capability that significantly improves the positioning in X and Y.

Sample size is limited to 3 x 3 cm in the X and Y directions and 1 cm in the Z direction. 

A Q-Control is also available to enhance images in liquid. 

Capabilities of the Scanning Probe Microscopy (SPM modes)

Atomic Force Microscopy modes

AFM
  • Contact mode
  • Tapping mode
  • Non-contact mode
  • Friction Force Microscopy (FFM)
  • Electrostatic Force Microscopy (EFM)
  • Kelvin Probe Microscopy (KPFM)
  • Piezoresponse Force Microscopy (PFM)
  • PinPoint AFM
  • Magnetic Force Microscopy (MFM)

Scanning Tunneling Microscopy modes

STM
  • Constant current mode
    • RT and controlled atmosphere (N2)

How to Request a Service

SERVICE REQUEST FORM

Open for NFFA Project

We are open to possible new requests through the European project NFFA.

Technicians

Scientist in charge

User's Committee

SPM Image Gallery

Tapping mode - Topography

Topography - oxide thin film

Magnetic Force Microscopy - hard disc

Kelvin Probe Microscopy - KPFM

Magnetic Force Microscopy - Phase Shift - LSMO thin film

Tapping mode - Topography - Organic fibers

Scanning Probe Microscopy

Address:

ICMAB
Campus UAB
08193, Bellaterra
Spain

E-mail:

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Phone: