• SCIENTIFIC & TECHNICAL SERVICES

    Electron microscopy service

  • SCIENTIFIC & TECHNICAL SERVICES

    Electron microscopy service

  • SCIENTIFIC & TECHNICAL SERVICES

    Electron microscopy service

  • SCIENTIFIC & TECHNICAL SERVICES

    Electron microscopy service

  • SCIENTIFIC & TECHNICAL SERVICES

    Electron microscopy service

The electron microscopy service was created in 2008 and is mainly dedicated to research groups of the Institute, but it can be accessible to external users as well.

The service consists of a scanning electron microscope (SEM) QUANTA FEI 200 FEG-ESEM installed in September 2008 (substituting an old PHILIPS 515 acquired in 2004 as a result of a process of reallocation between the CSIC centres CID and ICMAB) and a transmission electron microscope JEOL 1210 acquired in 1991. With the acquisition of the new SEM, the service provides ICMAB with a powerful and versatile tool capable to combine routine daily work with cutting-edge research. As a general strategy, this way the service aims at satisfying in-house the increasing demand of high-profile nanostructural characterization, thus eliminating technical limits imposed by external scientific-technical services.

To promote an efficient exploitation, the service offers: 1) Technical support given by two high-profiled (doctor) staff members. 2) Electronic management. 3) Effective user-training system by technical staff, oriented to achieve a maximum degree of self-service.

Technicians

Anna Esther Carrillo
Technical supervisor

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+ 34 935 801 853 (233-342)

Judith Oró Solé
Technical supervisor

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+ 34 935 801 853(296-344)

Equipment

Scanning Electron Microscope (SEM) QUANTA FEI 200 FEG-ESEM

The Quanta 200 ESEM FEG from FEI is a special and advanced type of high performance scanning electron microscope (SEM). The FEI Quanta 200 FEG is a state of the art field emission microscope that allows nanometer level inspection of materials.

Transmission electron microscope (TEM) 120 KV JEOL 1210

The 120 KV JEOL 1210 TEM features a high angular range (Tilt X= ± 60o, Tilt Y= ± 30o) providing a unique facility in the area of Barcelona for exploring large volumes of the reciprocal lattice by electron diffraction. It has technical support by a high profile (Dr) staff member. With a resolution below 3.2 Å this equipment is useful for low resolution structure imaging and characterization of nanoparticulate systems.

Booking Calendar


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Electron Microscopy
Service

Address:

ICMAB
Campus UAB
(in front of Firehouse)
08193, Bellaterra
Spain

Contact

By email:
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This email address is being protected from spambots. You need JavaScript enabled to view it.

By phone:

+34 935801853
Ext. 233-342 (SEM) 296-344(TEM)


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